About us
Our Company
etrology® is a development and consulting firm, providing state-of-the-art systems by integrating commercial hardware technology with professionally engineered, customized software.
At etrology®, we provide innovative solutions in automation, test & measurement, process & machine control, and data logging. Our products can be either stand-alone or custom integrated with an existing network, communications, or database infrastructure.
We support our solutions with a full range of consulting and maintenance services. Our services include custom-tailored application development, full-span training and support, consulting, and turnkey solutions – including system integration.
- CDSEM, Lithography, Metrology
- Statistical Process Control
- Metrology Equipment Characterization, Qualification and Technical Support
- Customer Relations and Technical Management
Etrology®
Our mission
Empower our customers to utilize the full potential of their assets and overcome dependence on the OEM.
ETROLOGY®
Our vision
To break the previously unbreakable bond between software and hardware through innovation, enabling our customers to separate their hardware needs from software solutions.
Etrology®
Our Team
With decades of experience, we combine technical mastery with a deep understanding of the industry to deliver exceptional solutions.
Our highly talented engineers are committed to providing customers with unparalleled solutions that optimize their semiconductor manufacturing processes. Together, we continue to drive innovation and shape the future of semiconductor metrology.
etrology®
Our Strengths
We’re deeply familiar with the processes and equipment used in the most advanced facilities in the world today.
Our team expertise includes some of the most sensitive and complicated areas in the industry, like optics, process metrology, solid state devices and many others.
Unleash the power of your business with our innovative solutions
Learn more about our advanced software for precise stochastic measurement, inspection, and defect detection.
