Advanced software for precise stochastic measurement, inspection and defect detection – tailored to your needs.
If the predefined flow of YieldPro™ doesn’t specifically match our customer’s needs, we offer YieldPro+™, a flexible, completely unrestricted configuration capable of handling a variety of cases where speed or specific process gating measurement is crucial.
YieldPro+™ is an advanced CD measurement application with innovative approaches in preprocessing, measurement, and Neural Network modeling to ensure superior precision and sensitivity. Large grab stochastic measurements, texture, background, defect estimation, and statistics are all available.
A larger field of view allows etrology® to measure up to 800 contacts in a single grab – increasing the likelihood of capturing random failures.
Find the best solution for your company. Speak to an Etrology representative today.